Centre For Advanced Electronics & Photovoltaic Engineering (CAEPE)
International Islamic University Islamabad (IIUI)
Name of Lab Inchagre/Focal Person : Engr. Shoaib Alam Position of Lab Inchagre/Focal Person: Laboratories Manager
Email ID of Lab Inchagre/Focal Person: [email protected] Phone & Cell# of Lab Inchagre/Focal Person: 051-9019927
Postal Addrss of Lab/Center: CENTRE FOR ADVANCED ELECTRONICS & PHOTOVOLTAIC ENGINEERING (CAEPE)
AL-FARABI RESEARCH COMPLEX
INTERNATIONAL ISLAMIC UNIVERSITY, SECTOR H-10 ISLAMABAD,
PAKISTAN
www.iiu.edu.pk/caepe		    

Measurement Analysis
Electrical/Electronics/Charge Based
S.No. Name of Equipment Status (Operational) Particulars of Tests Rates per Test (Rs.) Approximate time required for analysis after receipt of sample(s)
1 NANO-CHIP Reliability Grade Hall Effect System Operational Hall effect measurement/Quick scan (At room temperature) (Moblility,
Conductivity, Dopant type, Carrier concentration, Etc)		 1600/- Per Sample One Week
2 NANO-CHIP Reliability Grade Hall Effect System Operational Hall effect measurement/Quick scan (At low temperature 77K)
(Moblility, Conductivity, Dopant type, Carrier concentration, Etc)		 2000/- Per Sample 1.5 Weeks
3 Multi Head Probe Station/4 point probing Operational Wafer or Circuit level Electrical Characterization (I-V, C-V, G-V,
P-V measurements)		 2500/- Per Sample Two Weeks
4 ASMEC Electro-Physical Characterization System Operational Power/Energy Analysis 1500/- Per Sample Two Weeks
5 ASMEC Electro-Physical Characterization System Operational Charge Analysis 1500/- Per Sample Two Weeks
6 ASMEC Electro-Physical Characterization System Operational 2 point probing (Arrhenius Analysis/Activation Energy) (Under
vacuum) (77K-500K)		 3000/- Per Hour Two Weeks
7 ASMEC Electro-Physical Characterization System Operational 2 point Probing (I-V Characterization) (Under vacuum) (Insitu
thermal analysis 77k to 500k)		 2500/- Per Hour Two Weeks
8 ASMEC Electro-Physical Characterization System Operational 2 point Probing (G-V characterization) (Under Vacuum) (Insitu
thermal analysis 77k to 500k)		 2500/- Per Hour Two Weeks
9 ASMEC Electro-Physical Characterization System Operational C-V Characterization (Pulse and line scanned) (Under Vacuum) (Insitu
thermal analysis 77k to 500k)		 3000/- Per Hour Two Weeks
10 ASMEC Electro-Physical Characterization System Operational Charge-Deep Level Transient Spectroscopy (Q-DLTS) (Under Vacuum)
(Insitu thermal analysis 77k to 500k)		 3500/- Per Hour Two Weeks
11 ASMEC Electro-Physical Characterization System Operational Photo-stimulated Internal Field Transient Spectroscopy (PIFTS)
(Under Vacuum) (Insitu thermal analysis 77k to 500k)		 3000/- Per Hour Two Weeks
12 ASMEC Electro-Physical Characterization System Operational I-V Characterization (Room temperature scan) 1300/- Per Sample One Week
13 ASMEC Electro-Physical Characterization System Operational G-V characterization (Room temperature scan) 1300/- Per Sample One Week
14 ASMEC Electro-Physical Characterization System Operational C-V Characterization (Room temperature scan) 1300/- Per Sample One Week
15 ASMEC Electro-Physical Characterization System Operational Charge-Deep Level Transient Spectroscopy (Q-DLTS) (Room temperature
scan)		 1800/- Per Sample 1.5 Week
16 ASMEC Electro-Physical Characterization System Operational Photo-stimulated Internal Field Transient Spectroscopy (PIFTS) (Room
temperature scan)		 1700/- Per Sample 1.5 Week
17 Hot Chuck Operational I-V Characterization (Non-Vacuum) (300k to 900k) 1300/- Per Hour Two Weeks
18 Hot Chuck Operational G-V characterization (Non-Vacuum) (300k to 900k) 1300/- Per Hour Two Weeks
19 Hot Chuck Operational C-V Characterization (Non-Vacuum) (300k to 900k) 1300/- Per Hour Two Weeks
20 ASMEC Electro-Physical Characterization System Operational I(t) Transient behavior of Device w.r.t electric Current 1500/- Per Sample Two Weeks
13 Femto-meter Operational Extremely low current analysis for variable application 1300/- Per Sample Two Weeks
Process Fabrication & Deposition
S.No. Name of Equipment Status (Operational) Particulars of Tests Rates per Test (Rs.) Approximate time required for analysis after receipt of sample(s)
14 Atomic Layer Nano-Master Deposition System Operational Metal Deposition using boat and crucible (Physical Vapour
Deposition)		 10,000/- Per Run Two Weeks
15 MEMS Grade Spin Coating, Baking and Stirring Operational Spin Deposition Coating 1000/- Per Run for Half an Hour One Week
16 Electro-Chemical Impedance Spectroscopy Operational Impedance spectroscopy (Potentiostat/Galvnostat) 1300/- Per Sample 1.5 Week
17 Fume Hood Wet Bench Operational Sample Cleaning 700/- Per Run for Half an hour One Week
18 Hot Plate Operational Sample Baking/contact Sintering 700/- Per Run for Half an hour One Week
19 Fume Hood Wet Bench Operational Sample Chemical Etching 1500/- Per Run for Half an hour One Week
20 Rapid thermal Furnace Operational RTA/Furnace Annealing 1800/- Per Run One Week
21 Rapid thermal Furnace Operational Rapid thermal Oxidation 2000/- Per Run Two Weeks
22 Rapid thermal Furnace Operational Rapid thermal Nitridation 3000/- Per Run Two Weeks
23 Magnetron Plasma Sputtering Coater Operational Deposition Sputtering (Magnetron) Dual Mode both DC and RF 7000/- Per Run Two Weeks
24 Mask Aligner Operational Photo-lithography (Depends upon the nature of application
availability of the mask and over all experimentation)		 5000/- Per Sample As per the nature of the Experiment
25 Electro Spinning & Electro Spraying Operational Electro Spinning & Electro Spraying of nano layers, fibers and
materials for versatile applications		 3000/- Per Sample Two Weeks
26 Plasma Enhanced Chemical Vapor Deposition (PECVD) System Operational Deposition (PECVD) 7000/- Per Run As per the nature of the Experiment
27 Vibrating Sample Magnetometer Under Commissioning Magnetic Measurements 5000/- 2.5 Weeks
Structural Morphology & Imaging
S.No. Name of Equipment Status (Operational) Particulars of Tests Rates per Test (Rs.) Approximate time required for analysis after receipt of sample(s)
28 Atomic Force Microscopy Operational Atomic Scale Microscopy measurements AFM and STM Mode 3500/- Per Sample Three Weeks
29 Scanning Electron Microscopy Operational Scanning Electron Microscopy (BSE, EDX and Imaging down to
Sub-micron level)		 5000/- Per Sample two Weeks
30 X-Ray Diffraction System Under Commissioning Diffraction scan (Indices, planes, Material composition analysis) 3000/- Per Sample Three Weeks
31 High Resolution Thickness Profiling Operational Thickness Profiling of the surface down to nm through stylus
scanning		 2000/- Per Sample Two Weeks
Optical
32 Spectroscopic Ellipsometer Operational Spectroscopic Ellipsometry (Full Scan SE) (Refractive index,
Extinction coefficient, dielectric Coefficient, Thickness of the layer)		 3000/- Per Sample Two Weeks
33 Photoluminescence System (PLS) Operational Photoluminescence System (PLS) (Optical bandgap, defects mapping)
Low temperature analysis		 3000/- Per Sample One Week
Solar Cell/PV Evaluation
S.No. Name of Equipment Status (Operational) Particulars of Tests Rates per Test (Rs.) Approximate time required for analysis after receipt of sample(s)
34 Sun Simulator Class AAA Operational Sun Simulator test, Efficency of the cells along with the packing
fraction, electrical analysis, etc		 1500/- Per Sample One Week